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c) the tests aimed at specific applications, e.g. for:
I) restitution of high-mountainous models,
II) aerial triangulation methods (aeropolygon, methods using
auxiliary data),
Regarding the type of tests we distinguish between:
I) integral testscovering the entire flow of information
between the input and output as a unit. The execution is
relatively easy but the detection power is generally low.
II) differential testsor partial tests. They may have a
high detection power, but not all operations are accessible
for such tests.
Differential tests apply to:
individual operations (tracking, metr. corresp., record.),
transmissions (opt., mechan., electr.,
specific conditions (metric, physical),
calibration of zero positions (inner and outer orientation).
The means for execution can be subdivided into standard inputs
and auxiliary measuring or reference devices.
a) A standard input is a record of selected information. The
input structure consists of a record and the corresponding pro
gramme of presenting the information (temporal and spatial)
from the record to the system. The input structure can be defined
as: Si Di, D (R{ -f Mi), where the trend is to make Di or
Mi insignificant. Dt represents the imperfections of the input, con
sisting of regular Rt and random errors Mi, R{ and Mt are
superimposed.
A standard input should fulfil the following requirements:
I) it should be representative for the intended purpose of the
test,
II) it should stimulate disturbances to be investigated and be
insensitive to other disturbances (in detective tests),
III) the execution of the test and the subsequent data processing
should be straightforward and efficient.
For testing of photogrammetric instruments the following stan
dard inputs are commonly used:
I) Grid platesfor the stationary or metric tests. The grids
differ according to: density of points, orientation of lines,
geometric properties (square, perspective, spatial grids),
reproduction procedure (mechanical, chemical, photograph
ic), supporting glass-plate (accuracy of plainness of one
surface or planparallelism of both surfaces, thickness of
plates), accuracy (of grid points or of their calibration), etc.
